产品简介三维白光干涉表面形貌仪具有测量精度高、操作便捷、功能齐全、测量参数涵盖面广的优点，测量单个精细器件的过程用时短，确保了高款率检测。白光干涉仪的特殊光源模式，可以广泛适用于从光滑到粗糙等各种精细器件表面的测量。
(1)SuperViewW1三维白光干涉表面形貌仪设备提供表征微观形貌的粗糙度和台阶高、角度等轮廓尺寸测量功能；
(2)测量中提供自动对焦、自动找条纹、自动调亮度等自动化辅助功能；
(3)测量中提供自动拼接测量、定位自动多区域测量功能；
(4)分析中提供校平、图像修描、去噪和滤波、区域提取等四大模块的数据处理功能；
(5)分析中提供粗糙度分析、几何轮廓分析、结构分析、频率分析、功能分析等五大分析功能；
(6)分析中同时提供一键分析和多文件分析等辅助分析功能。
应用域
SuperViewW1
三维白光干涉表面形貌仪对各种产品、部件和材料表面的平面度、粗糙度、波纹度、面形轮廓、表面缺陷、磨损情况、腐蚀情况、孔隙间隙、台阶高度、弯曲变形情况、加工情况等表面形貌特征进行测量和分析。
应用范例：
白光干涉仪参数 | 型号 | | SuperViewW1 |
| 光源 | | 白光LED |
| 影像系统 | | 1024×1024 |
| 干涉物镜 | | | 标配：10× | 选配：2.5×、5×、20×、50×、100× |
| 光学ZOOM | | | 标配：0.5× | 选配：0.375×、0.75×、1× |
| XY位移平台 | 负载 | 10kg |
| | 控制方式 | 电动 |
| Z向扫描范围 | | 10mm |
Since established in 2002, Chotest Technology Inc. is focusing on the designing ａnd manufacturing of precision dimensional measurement ａnd calibration instruments.
With more than decade professional technology accumulation, Chotest has accumulated rich practical experience ａnd set up a strong team who is specialized in optics, machinery, Electronics ａnd information technology. At present, CHOTEST has more than 100 technology patents ａnd software intellectual property rights. With competence in Micro-Nano motion, 3D Reconstruction of Micro-Nano measurement, 3D Form ａnd Surface Analysis of Micro-Nano measurement, Large-scale 3D Measurement, Precision Sensing Probe ａnd Image processing technology, Chotest is capable to provide the customers with professional precision measurement solution in domains from Nanometer to Hectometer.
Our products are widely used by public metrology labs ａnd quality inspection workshops in the automotive, aerospace, machinery, metallurgy, power, ａnd petrochemical industries. Chotest`s service net is covered more than 30 provinces in China, ａnd is also focusing on the development in overseas markets like Europe ａnd APAC.
The goal of Chotest is to provide high-end dimensional measurement equipment to manufacturing industry all over the world.
更新时间：2024/7/25 11:24:36
总访问量：152746
总访问量：152746
